Electron Energy-Loss Spectroscopy in the Electron Microscope (The Language of Science)

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''The text....contains a wealth of practical detail and experimental insight....This book is an essential purchase for any microscopist who is using, or planning to use, electron spectroscopy or spectroscopic imaging.'' --- JMSA ''Provides the advanced student with an indispensible text and the experienced researcher with a valuable reference.'' --- American Scientist The Second Edition explores several new applications of EELS developed during the last ten years. Chapters include recent progress in parallel-recording detectors and image-filtering systems as well as spectral fine structure. This edition also features updated computer programs which will perform spectrum deconvolution and compute partial ionization cross-sections. more

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